During the event, participants will have the opportunity to take part in extended hands-on workshops on a selected research infrastructure. Below is a list of the available synchrotron beamlines, including an overview of their capabilities and the planned thematic scope of the training.
PIRX
The PIRX beamline is a bending-magnet source dedicated to x ray absorption spectroscopy in the soft x ray energy range. During the tutorial experiments, we plan to demonstrate the sensitivity of the method using both available detection modes: total electron yield (TEY) and partial fluorescence yield (PFY).
Next, we will showcase the element specificity of the method and the resulting changes in the spectra caused by different oxidation states and structures of a selected element. In the final part, we will focus on dichroism experiments, which involve radiation with different polarizations provided by the source.
The training will also include sample preparation and the transfer of samples between ultra-high-vacuum chambers, which is essential for soft x ray measurements.
URANOS
During the experiment, techniques such as angle-resolved photoemission spectroscopy (ARPES), spin-resolved photoemission spectroscopy (spin-resolved ARPES), soft X-ray photoelectron spectroscopy (soft XPS), circular dichroism ARPES (CD-ARPES), and low-energy electron diffraction (LEED) will be demonstrated using a calibration sample exhibiting surface bands with well-defined spin polarizations. Real-time, angular- and spin-resolved Fermi surface maps will be acquired.
Soft XPS will be employed to assess the level of surface contamination and to evaluate the influence of surface impurities and residual gases under UHV conditions on ARPES measurements. LEED will be used to determine the surface crystallographic structure of the sample.
The impact of experimental geometry, temperature, and beamline parameters on the measured spectra will be systematically discussed. If time permits, the differences between CD-ARPES and spin-resolved ARPES will also be demonstrated.
PHELIX
The PHELIX beamline is an undulator based facility operating in the soft X-ray range. The current end-station setup enables users to conduct the photoelectron spectroscopy, including X-ray Photoelectron Spectroscopy (XPS), Angle-Resolved Photoelectron Spectroscopy (ARPES), and Spin-Resolved ARPES (Spin-ARPES), as well as absorption spectroscopy techniques such as Total Electron Yield (TEY), Total Fluorescence Yield (TFY), and Partial Electron Yield (PEY).
The workshop at PHELIX beamline, will be divided into two main parts: sample preparation and measurement. The primary objective is to demonstrate how the preparation of a clean sample surface affects the quality of photoelectron spectra.
We will focus on two types of materials: van der Waals materials and thin films prepared under ultra-high vacuum (UHV) conditions. For each case, XPS and ARPES measurements will be performed on both clean (in situ prepared) samples and samples exposed to ambient air, allowing for a direct comparison of surface quality and its impact on the measured spectra.
ASTRA
The practical classes on the XAFS method will involve performing measurements on model systems and analyzing two spectral regions: XANES and EXAFS. XANES measurements will be carried out for a group of metal oxides in order to extract information about the chemical state of the absorbing element (e.g., oxidation state) as well as its immediate local environment. EXAFS measurements will be performed on a model metallic thin film, where we will determine the type of crystal structure and extract structural information encoded in the EXAFS signal. During the practical session, participants will learn how to use the widely adopted Demeter software package for XAFS analysis, as well as gain basic knowledge of building and applying structural models and simulating theoretical XAFS signals.
PolyX
During the experimental part at PolyX, we will carry out a demonstration experiment combining µXAS measurements in transmission and fluorescence modes with 2D µXRF mapping and X-ray imaging, showcasing a complete workflow — from optimizing the measurement settings to element-sensitive spatial mapping and obtaining chemical information about the sample.
DEMETER (PEEM)
The aim of the experiment is to investigate the growth of cobalt (Co) thin films on the Fe₃O₄(001) surface and to determine their structural, chemical, and magnetic properties using LEEM/XPEEM techniques and synchrotron-based measurements.
The Co layers are deposited by molecular beam epitaxy (MBE), and their growth is monitored in situ using Low-Energy Electron Microscopy (LEEM), enabling observation of island nucleation, growth, coalescence, and identification of the growth mode. Simultaneously, diffraction analysis (LEED) allows for the determination of the crystal structure and epitaxial relationships between the Co layer and the substrate.
After growth, the samples are investigated using X-ray Photoemission Electron Microscopy (XPEEM) with synchrotron radiation. X-ray Absorption Spectroscopy (XAS) measurements provide information on the chemical composition and oxidation states, while imaging based on X-ray Magnetic Circular Dichroism (XMCD-PEEM) enables the study of magnetic domains, anisotropy, and magnetic coupling at the Co/Fe₃O₄ interface. Additionally, local diffraction (μ-LEED) allows for correlating structural properties with chemical and magnetic characteristics.
